Bipolar Working Group

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Contributions:

2023:

• M. Tang, A. Pawlak: "Member Matters"

• B. Ardouin, R. Hersent: "III-V Lab presentation"
• T. Zimmer, T. Bouzar, J.D. Arnould, S. Fregonese: "What causes the fluctuations in f_max with respect to frequency?"
• M. Krattenmacher: "DMT-extraction: A FOSS Python framework for parameter extraction showcased by a PSP extraction workflow"
• K.-W. Pieper: "First Experiences in Modeling using an Artificial Neural Network"
• H. Saleh, L. Iogna-Prat, M. Ben-Sassi: "Characterization and modeling of FD-SOI transistors for RF Switch applications"
• M. Willemsen: "COMPACT MODELING OF NONLINEAR SELF-HEATING IN SIGE HBTS"
• D. Céli: "A Novel FoM for Determining the Base Resistance of Bipolar Transistor"
• K. Molnár: "Remarks on RF and Breakdown Modeling of Integrated Diodes"
• L. Prat, F. Zaki: "Geometry scaling improvement of ASM-HEMT model for GaN "
• Z. Huszka: "Benchmarking the vces and vdck model variants of HICUM "

• T. Rosenbaum: "Member Matters"

• C. Weimer: "Introduction SemiMod GmbH"
• G. U’Ren: "Heterogeneous GaN on RFSOI"
• F. Zaki, L. Iogna-Prat, H. Saleh and G. U'Ren: "GaN ASM-HEMT DC Geometry Scaling Development"
• A. Biswas, P. Popp, M. Cotorogea, K.-W. Pieper, G. Alia: "OptimizationTools forCalibrationof Compact Models forIGBTs and Diodes"
• T. Rosenbaum: "A fun? presentation/quiz on parameter handling and the multiplication factor in SPICE simulators"
• G. Fischer, N. Hennig, T. Mausolf: "Investigation of SiGe HBT and MOSFET Gate Oxide Reliability under RF Stress"
• C. Weimer, M. Schröter: "Characterization and Modeling of SiGe HBT Reliability for RF Circuit Design"
• C. Weimer, M. Schröter: "A Comparative SiGe and InP HBT RF Reliability Study"
• H. Alius, T. Gneiting: "Modeling of CMOS Processes at Cryogenic Temperatures"
• D. Céli: "Extraction of Junction Capacitance Parameters from C(V) Curves"
• Z. Huszka: "Removing the I_CK implied bumps in HICUM"

• "Agenda AKB 2021"
• T. Rosenbaum: "Member Matters"

• G. U’Ren: "Introduction X-FAB France"
• M. Müller, P. Kuthe, M. Krattenmacher, M. Schröter "Overview of Free Software Packages for Compact Modeling"
• D. Céli, Z. Huszka: "Parameter Extraction Using QucsStudio..."
• K..-W. Pieper: "Finding root causes of convergence failures in circuit simulation"
• T. Rosenbaum: "A look on characterization of semiconductor devices"
• G. Fischer: "What’s the maximum tolerable current density for a SiGe HBT?"
• C. Weimer and M. Schröter: "An Experimental approach to investigating device-level RF reliability"
• F. Sischka: "Experiences with Using Gummel-Poon Models of Discrete Devices"
• P. Popp, M. Cotorogea, D. Ludwig, G. Alia, A. Biswas: "Behavioral compact models of IGBTs and Si-diodes for data sheet simulations using a machine learning based calibration strategy"
• X. Jin, G. Liang, and M. Schröter: "Characterization and modeling of thermal impedance for advanced SiGe HBT"
• Z. Huszka: "Revisiting the Extraction of γC"

• "Agenda AKB 2019"
• "Company Information"
• T. Rosenbaum: "Member Matters"

• R. Iskander, T. Gneiting: "Systematic Prediction and Prevention of all Types of Substrate Noise Coupling Effects"
• Y. Li: "A Cognitive Software for Designing First-Time Right Analog IP"
• K.-W- Pieper: "An Approach for Improving Circuit Convergence using HiSIM -HV as an Example"
• K.Molnár: "TSV Modeling from kHz to RF"
• F. Sischka: "Experiences with Using the ASM-HEMT Model for III/IV HEMTs"
• W. Grabinski: "FOSS TCAD/EDA Tools for Compact Modeling "
• G. Fischer: "Low Frequency Noise in SiGe HBTs"
• S.R. Panda, S. Fregonese, A. Chakravorty, T. Zimmer: "TCAD versus High Frequency Mesurements of SiGe HBTs "
• M. Müller, M. Schröter: "SELECTED RESULTS OF HICUM PARAMETER EXTRACTION FOR InP HBTS"
• N. Derrier: "Breakdown Voltage and SOA for HBTs: a pragmatic approach for PDKs"
• M. Jaoul, C. Maneux, T.Zimmer, D. Céli: "Breakdown Voltage, SOA and Aging of HBTs: A Physics Base approach for Compact modeling"
• D. Céli: "Basic Principle of Model Parameter Extraction - Application to the Knee Current of SGP Model with QucsStudio"
• Z. Huszka: "Parameter Extraction with QucsStudio_v2.5.7"
• Z. Huszka: "A Solution to the Qp0 Issue in Hicum Parameter Extraction"

• "Agenda AKB 2018"
• S. Locci: "Member Matters"

• T. Rosenbaum: "U-shaped junction capacitance modelling and proposal for diode CMC model enhancements"
• C. Yadav, M. Deng, S. Fregonese, M. De Matos and T. Zimmer: "Measurement issues of on-Silicon de-embedding test structures in the Sub-THz range"
• K.-W. Pieper, Y. Karafi: "Compact Model Parameter Extraction with Machine Learning Algorithms "
• U. Sterr: "Pulse classification machine learning approach"
• T. Gneiting: "Mittendrin in der Praxis der Rauschmessung"
• C. Maier: "Power MOS Modeling For Commutation Cell Applications"
• F. Sischka: "Impedance Measurements for Successful Device Modeling"
• D: Céli , M. Jaoul, T. Zimmer: "Extension of HICUM/L2 Avalanche Model at High Current: Proposal"
• Z. Huszka, M. Schröter: "Capacitance Splines for Arbitrary Doping Variations"
• B. Ardouin: "RELIABILITY MODELING: a brief communication on theoretical issues and practical implementation difficulties in VerilogA"

• S. Locci: "Member Matters"

• R. D'Esposito, S. Fregonese, S. Balanethiram, T. Zimmer: "Frequency analysis of the penetration depth of the heat flow in SiGe HBTs"
• A. Biswas: "Next Level of IGBT Compact Model Implementation"
• M. Cotorogea: "Virtual prototyping for power diode and IGBT development"
• F. Sischka: "Transmission Line Pulse (TLP) Measurements and Simulations of Bipolar Transistor Snap-Back Effect"
• T. Gneiting, H. Alius, F. Korndörfer, T. Mausolf: "Aging modeling of an LDMOS device using the new built-in age model of HiSIM HV 2.4."
• C. Maier: "Experiences with Aging Simulation"
• K.-W. Pieper: "Aging Simulation with variation of several model parameters"
• B. Ardouin: "Practical Implementation of Reliability Aware Compact Models in Simulation Software Environment"

• "Picture"
• "Agenda AKB 2016"
• J. Berkner: "Member Matters"

• G. Panagopoulos: "pnp modelling in standard CMOS technologies"
• B. Ó hAnnaidh: "Analog Devices in Ireland, celebrating 40 years of Advancing Technologies"
• F. Sischka: "Tutorial About Applying Impedance Curve Modeling"
• F. Sischka: "LED Impedance Modeling Examples"
• A. Pawlak: "On the experimental determination of fmax"
• F. Sischka: "Revue of Historic BJT Performances and Modelings"
• T. Rosenbaum: "TCAD setup for an advanced SiGe HBT technology applied to the HS, MV and HV transistor versions"
• E. Seebacher: "TCAD based variability modeling"
• K.-W. Pieper: "A SPECTRE Sub-Circuit Model for Resistors including Self-Heating"
• G. Fischer: "Temperature Dependence of the Relevant Sheet Resistances in SiGe Heterojunction Bipolar Transistors"
• T. Zimmer: "BEOL-investigation on selfheating and SOA of SiGe HBT"
• D. Céli: "Extraction of Parasitic Substrate PNP Parameters (and even more) of NPN Devices Without Access to the Substrate Terminal"

• "Agenda AKB 2015"
• J. Berkner: "Member Matters"

• W. Grabinski: "Qucs: Open Source Simulator"
• K.-W. Pieper: "Diode_CMC model"
• J. Berkner: "How to model the temperature dependence of a diode tunnel Current"
• J. Wilhelmi: "Practical experience with thermal system Flex TC"
• Z. Huszka: "Reducing the Computational Cost of HICUM/L2 at Invariant Node Count"
• G. Fischer: "Analysis and Simulation of SiGe HBT Ageing"
• A. Pawlak: "Advanced Modeling of Silicon-Germanium HBTs"
• T. Rosenbaum: "Breakdown mechanisms in advanced SiGe HBTs: scaling and TCAD calibration"
• H. Wald: "Integrated IGBTs: Challenges in Characterization and Modelling"
• M. Willemsen: "Introduction to and overview of Mextram"
• D. Céli: "Runtime Analysis of 4 VA HiCuM Versions with and without Internal Solver"

• "Group picture"
• "Agenda AKB 2014"
• J. Berkner: "Member Matters"

• T. Rosenbaum: "Automated Transit Time and Transfer Current Extraction"
• F. Sischka: "Semiconductor Noise in the Time and Frequency Domain"
• M. Tang: "Parasitic Bipolar Modelingfor Voltage Scalable MOSFET Transistors"
• J. Berkner: "Bondwire Inductance Calculation and Measurement"
• R. D'Esposito: "Investigation of transient intra-device thermal coupling"
• A. Pawlak: "Status of HICUM/L2 Model"
• D. Céli: "Investigation on Bias Dependence of Critical Current I_CK in HICUM Models"
• N. Derrier: "Experience of BE Tunneling current and BC Barrier effect with HICUM L2 v2.32"
• T. Rosenbaum: "Barrier modeling and extraction"

• "Group picture"
• "Agenda AKB 2013"
• J. Berkner: "Member Matters"

• A. Fox: "SiGe HBT Technology Development in the DOTSEVEN Project"
• M. Elkhouly: "Determination of S-parameters in the 200-300 GHz range"
• P. Braureis: "Deembedding of SiGe multifinger HBTs to 110 GHz - problems and solutions"
• F. Korndörfer: "Simulation und Messung des thermischen Widerstandes von Silicium-Germanium- Hetero-Bipolartransistoren"
• A. Pawlak: "Coupled extraction of RE and RTH based on DC output curves"
• T. Zimmer "Transistor's self-und mutual heating and its impact on circuit performance"
• F. Sischka:"Experiences with Hicum0"
• F. Stein: "Selected Topics in Bipolar Modeling and Measurement"
• J. Wilhelmi: "Spice-extraction with included temperature parameters using SGP model"

• "Group picture"
• "Welcome to the 25th Working Group Bipolar (AKB) 2012"
• J. Berkner:"Member Matters"

• G. Fischer:"Substrate Coupling for 500GHz HBTs"
• B. Ardouin:"Dynamic Aging Modeling"
• R. Lachner:"DOTSEVEN. Towards 0.7 THz SiGE"
• M. Schröter:"Implementation of HICUM/L2 version 2.31"
• W. Kraus:"Hicum Lessons learned or QA in Spectre"
• J. Berkner, K.-W. Pieper:"What makes the difference? On model QA"
• S. Locci:"How to make corner models for BJTs"
• M. Weiss, T. Zimmer:"On pulsed RF measurements"

• "Group picture"
• "Proceedings of the 24th Working Group Bipolar"

• :J. Berkner "Member Matters"
• A. Pawlak: "Introduction to the AKB forum"
• B. Ardouin: "Review and Advances in Emitter Resistance Extraction Methods"
• Z. Huszka: "Extraction of the diffusion voltage and the fixed part of junction capacitances"
• P. Braureis: "Modeling of Infineon BFP740 using HICUM level 0v1.2 in QUCS 0.0.15"
• G. Fischer: "HICUM/L2 Models for SiGe-HBTs in IHP 0.13µm BiCMOS Technology"
• A. Bhattacharyya: "NQS modelling with HiCuM: What works, what doesn't"
• N. Derrier: "Description of a SPICE Gummel-Poon Extraction Flow for Natural SubstratePNP transistors"
• B. Senapati: "Characterization and Modeling of Lateral PNP Bipolar Transistor in CMOS Process"
• J. Berkner: "Cold S-Parameter Measurements on Vertical PNP Transistors"
• J. Bazzi: "On-Si calibration vs ISS calibration"
• W. Kraus: "Software for Statistical Device Modeling: Use R"
• K-W. Pieper: "Calculation of standard deviations and correlation coefficients for bipolar transistors"

• "Group picture"
• "Picture impressions"
• "Agenda"

• J. Berkner: "Member Matters"
• B. Ardouin: "XMOD TECHNOLOGIES - Company presentation"
• T. Zimmer: "Impact of process variation on the circuit performance (RO / LNA)"
• G. Fischer: "VBIC Models for High-Speed and High-Voltage HBTs in IHP‘s 0.13µm BiCMOS Technology"
• J. Berkner: "What happens, if VBIC fails in Quasisaturation?"
• B. Senapati: "Schottky-Barrier Diode Modeling Using VBIC"
• Z. Huszka: "Revisiting the Charge Concept in HBT/BJT Models"
• C. Céli: "How to Avoid HICUM/L2 v2.24"
• A. Pawlak: "Application of HICUM/L2 v2.30 to advanced multi-100GHz SiGe HBTs"
• J. Wilhelmi: "Darlington transistors Two ways of modelling"
• P. Braureis: "On the feasability of single touch on wafer calibration using HBT (on wafer ECAL)"
• N. Derrier: "Limitations of Bipolar Compact Models for LF Noise PART II –Answers to HICUM WS 2010 remarks"

• "Photos from Conference"
• "Agenda"
• "Member Matters"

• G. Fischer: "Thermal Capacitance cth – its Determination and Influenceon Transistor and Circuit Performance"
• P. Braureis: "Thermal impedance measurementand modeling including thermal coupling"
• J. Wilhelmi: "Improvement of SGP modelling using additional devices"
• C. Hanke: "Pulsed S-parameter measurements using ICCAP"
• Z. Huszka: "Extraction of RE and its temperature dependence from RF measurements"
• H. Wald: "Investigation of lateral PNP BiCMOS transistors for a special application in DVD PDICs"
• D. Celi: "HICUM/L0 v1.2: Application to Millimeter Wave Devices"
• J. Berkner: "Tips and Tricks for Daily Modeling Work"

• "Photos from Conference"
• "Agenda"
• "Member Matters"

• W. Riethmüller: "NXP Overview"
• D. Rösener: "A Brief Introduction"
• D. Celi: "HICUM/L0 v1.2 Parameter Extraction and Validation"
• N. Derrier: "HICUM L0 1.2 experience on various ST BiCMOS technologies"
• J. Berkner: "Experience with Hicum L0 v1.2 (improved IFX version)"
• Z. Huszka: "IGICCR Part II: Full HicumL2 Extraction Flow with Self Heating"
• J. Berkner: "Proposal for modeling the barrier effect in the bipolar compact model Hicum L0"
• B. Senapati: "Bipolar Modelling for ESD Circuits Design"
• P. Braureis: "Probe Tip Characterization UsingSelf-Calibration"
• M. Schröter: "I_T parameter extraction issues in HiCuM/L2 for very advanced HBTs"

• "Picture Impressions"
• "Agenda"
• "Member Matters"

• U. Schindel: "20 Jahre Bipolar Arbeitskreis"
• J. Berkner: "About Models, Designers and Simulators"
• H. Schmidt-Habich: "Infineon Company Overview"
• D. Celi: "Investigation of New Bipolar Geometry Scaling Laws"
• B. Senapati: "Measurement and Scalable Model for Parasitic PNP of HV PMOS"
• M. Schröter: "HICUM - Productization and Support Update"
• C. Thiele: "HICUM/L0: Improvement of the injection width description"
• Z. Huszka: "Temperature Invariant Extraction of IS and VER"
• G. Fischer: "Simulation of IB Degradation after Stress"
• P. Baureis: "Avalanche Breakdown in GaInP/GaAs HBTs"
• T. Zimmer: "Investigation of Gecontent in the BC transition region with respect to transit frequency"
• J. Berkner: "Bandgap Reference Simulation Principles and Problems"
• C. Schönbein: "Bandgap Reference Simulation/Measurement Comparison"
• W. Kraus: "Statistical Simulations of Bandgap Circuits"
• E. Gondro: "Statistical Simulation Methodologyfor a Smart Power Technology"
• H. Wald: "Modelling of diffused resistors"

• "Photos from Conference"
• "Agenda"
• J. Berkner: "How to avoid negative slope in HL0 IC"
• D. Celi: "About h_JEi Parameter Extraction..."
• F. Korndörfer: "Extraction of CTH with pulsed measurements"
• W. Kraus: "PCM- and Physics-Based Statistical BJT Modeling"
• J. Berkner: "Member Matters"
• F. Pourchon: "BVCER simulations with HICUM"
• R. Reuter: "Nearly fully automated extraction of VBIC models by optimization of special rf-goals"
• B. Senapati: "Modelling of Parasitic PNP in CMOS Process"
• C. Thiele: "Problems during the extraction of the HICUM/L0 model parameters IQFH and TFH"
• T. Zimmer, P. Baureis, H. Beckrich, P.Y. Sulima: "HBT's thermal impedance measurement"

• J. Berkner: "The apparent parasitic breakdown"
• J. Berkner: "Deembedding Effects on Cold S-parameter Measurements"
• A. Hammer: "VBIC 1.20 Benchmarking"
• Z. Huszka: "Revisiting the Integral Charge Control Relation (ICCR)"
• Ch. Maier: "Modeling of Parasitic Bipolars in n-DMOS Transistors"
• M. Schröter: "HICUM/L0 - Extraction results and experience"
• Ch. Wipf: "Modeling a parasitic vertical bipolar transistor"

• Photos from Conference
• Agenda
• J. Berkner: "Cleaning Calibration Substrates" (pdf-Datei)
• J. Berkner: "Current Tendencies in SiGe BiCMOS Technologies Developments" (pdf-Datei)
• Z. Huszka: "Method for the Determination of the Optimal Noise Parameters from SPICE Simulations" (pdf-Datei)
• W. Kraus: "Extraction Method for Thermal Resistance" (pdf-Datei)
• K.-W. Pieper: "Modeling Reverse Recovery Effect" (pdf-Datei)
• R. Reuter: "VBIC versus HICUM for high-GHz, high Power Applications" (pdf-Datei)
• R.F. Scholz: "Modellierung von 80 GHz PNPs mit VBIC" (pdf-Datei)

• J. Berkner: "Bildbericht mit Agenda" (pdf-Datei)
• E. Seebacher: "Vorstellung der AMS" (pdf-Datei)
• J. Berkner: "S-Parameter Measurements using HP8510" (pdf-Datei)
• J. Fellner: "Low Frequency Noise Measurement and Noise Modeling" (pdf-Datei)
• Z. Huszka: "Estimation of fmax by the Common Intercept Method" (pdf-Datei)
• J. Jongsma: "Using SiGe in a CMOS World" (pdf-Datei)
• W. Kraus: "2D-Widerstandssimulation mit Finiten Elementen" (pdf-Datei)
• G. Rappitsch: "VBIC - Simulator Implementation and Benchmarking" (pdf-Datei)
• R.F. Scholz: "S-Parameter Messungen bis 110GHz" (pdf-Datei)
• R.F. Scholz: "Simple Emitter and Collector Scaling Approach with VBIC for Low-cost SiGe:C HBT’s" (pdf-Datei)
• E. Seebacher: "CODESTAR Compact modelling of on-chip passive structures at high frequencies." (pdf-Datei)

• Fotos von der Tagung: Bild 1  Bild 2  Bild 3  Bild 4  Bild 5  Bild 6
• J. Berkner: "How to improve ICCAP’s ability to generate scalable bipolar compact models"(pdf-Datei)
• P. Brenner: "Test Structures and a new approach for fast and accurate extraction of specific NPN parameters"(pdf-Datei)
• W. Graudszus: "Probleme bei der Parameterextraktion an Raumladungskapazitäten"(pdf-Datei)
• W. Kraus: "Kontaktwiderstände"(pdf-Datei)
• R. Reuter: "New Layout and Deembedding Technique based on Transmission..."(pdf-Datei)
• J. Schmidt: "Current Gain in SiGe HBTs"(pdf-Datei)

• IHP_Luftaufnahme
• Tagung
• Protokoll(pdf-Datei)
• J. Berkner: "Erfahrungen_mit_HICUM"(pdf-Datei)
• M. Ernst: "Bipolar_Modellierung_bei_AMS"(pdf-Datei)
• H.B. Erzgräber: "Spiral_Iductors"(pdf-Datei)
• F. Fürnhammer: "IHP_Technologie"(pdf-Datei)
• W. Kraus: "Varaktormodellierung"(pdf-Datei)
• H.-M. Rein: "Simulating_Avalanche_Breakdown"(pdf-Datei)
• R. Reuter: "Bipolar_Modellierung_bei_Motorola"(pdf-Datei)

• Agenda(pdf-Datei)
• J. Berkner: "1/f-Noise BJT Measurements using a Low Noise Current Amplifier"(pdf-Datei)
• P. Brenner: "Fast Extraction of Area Specific Base-Pinch and ..."(pdf-Datei)
• Petzold: "Temperatur Transform"(pdf-Datei)
• "Sch_n_IFX_WS"(pdf-Datei)

• Agenda(pdf-Datei)
• P. Brenner: "Skalierbares Varaktormodell zur layoutabhängigen Simulation..."(pdf-Datei)
• Gerstenberg: "Thermochuck Kalibrierung"(pdf-Datei)
• J. Berkner: "Messungen zur Verifizierung der Kalibrierung des NWA HP8510C"(pdf-Datei)

• Agenda(pdf-Datei)
• P. Brenner: "Vorstellung des Bipolar-Transistormodells SQ3..."(pdf-Datei)
• J. Berkner: "VBIC Parameter Extraktion"(pdf-Datei)

• Agenda(pdf-Datei)
• J. Berkner: "Emitter and Collector Resistance Determination..."(pdf-Datei)