In order to enable meaningful testing of new model equations a completely new set of test parameters is used for HICUM/L2 from version 2.31 on.

Additionally, a new test case was added for the noise modeling. The original test case "noise1" performs a test with correlated noise turned off (as default in v2.31). The new test case "noise1Cor" is performed with correlated noise turned on.

For backward compatibility tests, the original model card (used for QA in previous versions) can also be tested. The results for the test cases are called *_org.

Testing the pnp-transistor was made by setting "
checkPolarity y" and defining 


nTypeSelectionArguments     hic2_full type=1
  
pTypeSelectionArguments     hic2_full type=-1

for the respective simulators. In case of built-in models, "hic2_full" has to be replaced by the model name in the simulator.

The frequency range for the S-parameter simulations has been extended from 10 GHz to 1 THz to cover frequency ranges of modern SiGe-HBTs.

The complete test setup including all test parameter sets and changed/extended test cases for the CMC-QA toolkit version 1.5 can be downloaded from the website. The QA results given on the website are created for this setup.

@ 2012-11-19, CEDIC, TU-Dresden