Modul
Modeling and Characterization of Electron Devices

Prof. Dr.-Ing. M. Schröter
Institut für Grundlagen der Elektrotechnik und Elektronik

Lecture	Location	Day	Start	Time	Duration
Lecture	BAR/218/U	Thursday	11.04.2013	5.DL	1DL

Objective of the module (2/2/2):

The module emphasizes current research topics and trends in the area of modeling and characterization of micro- and nanoelectronic devices. Students acquire expertise on:

• applying computational methods and tools for simulating the behavior of micro- and nanoelectronic devices;
• solving independently research- and industrial-like problems in the area of modeling and characterization of micro- and nanoelectronic devices (from conception to the discussion of results);
• analyzing and interpreting experimental data;
• becoming quickly familiar with new topics employing current research literature.

Date	Contents
11.04.2013	Organisation, overview of topics
18.04.2013	MOS transistor modeling
25.04.2013	Carbon Nano Tubes and FETs
16.05.2013	SiGe HBT compact modeling
30.05.2013	Electrothermal modeling
06.06.2013	Algorithmic benchmark circuit design
13.06.2013	Statistical modeling
20.06.2013	Parameter extraction basics
27.06.2013	Parameter extraction HICUM
04.07.2013	On-Wafer S-parameter measurements
11.07.2013	Noise in SiGe and AIIIBV bipolar transistors
18.07.2013	Large-signal, Distortion and measurements

Assessment:

Grading of this course requires the successful completion of a project on a topic selected during the course period. The topic may include device simulation, modeling and parameterextraction, or a literature study on novel devices. The grading will be based on the submittedproject documentation.

Downloads:

• Simulator DEVICE
• Programdocumentation DEVICE
• ELPAPLOT
• Matlabroutines
• Project Resistor
• Project Diode