3d European HICUM Workshop
June 16/17, 2003
Dresden, Germany
Chair for Electron Devices and Integrated Circuits (CEDIC)
University of Technology Dresden / GWT, Germany
http://www.iee.et.tu-dresden.de/iee/eb/eb_homee.html
Workshop location: GWT, Chemnitzer Str. 48b, 01187 Dresden
Agenda
Day 1
10:30 Schroter: Welcome and opening remarks
10:45 ALL: brief introduction
Session I - Compact Modeling
11:00 Schroter, "Bipolar transistor modeling issues"
11:30 Schroter, "Overview on HICUM - status and activities"
12:30 ALL: discussion on model development, priorities, ...
13:00 Lunch (on-site)
Session II - Parameter determination
14:30 Malorny/Schroter, "Issues of Tf and fT determination“
15:00 Ardouin: "A method for accurate transit time determination"
15:30 Berger/Celi: "Geometry scalable parameter extraction methodology applied to HICUM“
16:15 Break (and discussions)
16:45 Sakalas/Kornau/Kraus/Schroter, "Modeling of SiGe power HBT IM distortion with HICUM"
17:30 Kraus: "Scalable test structures and models for de-embedding"
18:15 Zimmermann/Zampardi(Skyworks)/Schroter , "Modeling of GaAs/AlGaAs HBTs using HICUM and
TRADICA"
18:45 ALL: discussion on extraction issues and other topics of interest (model implementation, ...),
wrap-up of day 1 (list of action items, EDA vendors,...)
19:30 Departure for dinner
Day 2
Session III - Thermal effects
09:00 Herricht/Schroter, "Bandgap reference design considerations and model implications"
09:40 Zimmer: "Obtaining isothermal data with standard measurement equipment"
10:00 Sischka: "Introduction into the principle of pulsed S-parameter measurements"
10:30 Berkner, "Pulsed S-Parameter Measurements using the HP85124 Pulse System"
11:00 ALL: discussion
11:15 Break (and discussion)
Session IV - Miscellaneous
11:30 Perraud , "Status of SPICE3 development at CAEN"
11:50 Kraus , "Statistical modeling with CircuitSurfer"
12:20 Schroter, "TRADICA - Status, activities and plans"
12:40 Zimmermann, "TRADICA application demo"
13:15 Lunch (on-site)
Session V: Discussion on topics carried over
14:30 ALL: discussion (possibly in working groups) on various topics:
statistical modeling: technical issues, difficulties, requirements, viable experimental approaches (test structures,
measurements, ...), available EDA support and infrastructures ? ("circuit surfer", ...)
modeling issues: priorities for improved procedures, infrastructure alternatives, model support and maintenance
parameter extraction: what is missing, requirements, test structures, software needs (ICCAP, TRADICA, ?)
model implementation: verification and quality assurance