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HICUM related papers

Publications Prof. Dr.-Ing. habil. M. Schröter

[82] M. Schröter and H. Tran, "Regional Approach Methods for SiGe HBT compact modeling" 6th HICUM Workshop, Heilbronn (Germany), June 2006
[81] A. Chakravorty, S. Lehmann, M. Schröter, "HICUM/Level0 - Update" 6th HICUM Workshop, Heilbronn (Germany), June 2006
[80] K.E. Moebus, M. Schröter, "Device sizing and design optimization" 6th HICUM Workshop, Heilbronn (Germany), June 2006
[79] S. Lehmann, M. Schröter, J. Krause, A. Pawlak, "Non-standard geometry scaling effects" 6th HICUM Workshop, Heilbronn (Germany), June 2006
[78] R. M. Malladi, K. M. Newton, M. Schröter, V. Borich, S. L.Sweeney, J. Rascoe, S. Venkatadri, J. Yang, S. Chen, "Extraction of Scalable HiCuM Parameters and Verifikation for Advanced SiGeHBTs" Workshop On Compact Modeling, Nanotech 2006
[77] A. Chakravorty, M. Schröter, P. Sakalas, J. Herricht, "Correlated Noise Modeling - An Implementation into HICUM" 6th HICUM Workshop, Heilbronn (Germany), June 2006
[76] A. Chakravorty, M. Schröter, "HICUM/L2 - Productization and Release Update" 6th HICUM Workshop, Heilbronn (Germany), June 2006
[72] J. Herricht, P.Sakalas, M. Schröter, P.Zampardi, Y. Zimmermann, F. Korndörfer, A. Simukovic, "Verification of p -Equivalent Circuit based Microwave Noise Model on AIII BV HBTs with Emphasis HICUM", International Microwave Symposium, Long Beach (CA), pp., 2005
[65] Y. Zimmermann, M. Schröter, P. Zampardi, A. Klimashov, G. Tkachenko, "III-V HBT Modeling, scaling and parameter extraction using TRADICA and HICUM", IEEE Workshop on Power Amplifiers, San Diego, CA, 2003.
[64] M. Schröter, P. Sakalas, W. Kraus, L. Kornau, J. Herricht, “Modeling of LEC Si/SiGe power transistors with HICUM”, IEEE Workshop on Power Amplifiers, San Diego, CA, IEEE Workshop on Power Amplifiers, San Diego, CA,
[62] P. Sakalas, M. Schröter, W. Kraus, and L. Kornau, “Modeling of SiGe power HBT intermodulation distortion using HICUM”, Proc. ESSDERC, Lisboa (Portugal), pp. 311-314, 2003.
[57] M. Schröter, H. Jiang, S. Lehmann and S. Komarow, “HICUM/Level0 - a simplified compact bipolar transistor model”, IEEE BCTM, Monterey (CA), pp. 112-115, 2002.
[56] D. Berger, D. Celi, M. Schröter, M. Malorny, T. Zimmer, and B. Ardouin, “HICUM parameter extraction flow for a single transistor geometry”, IEEE BCTM, Monterey (CA), pp. 116-119, 2002.
[53] M. Schröter, “Staying current with HICUM”, IEEE Circuits and Devices Magazine, Vol. 18, No. 3, pp. 16-25, 2002.
[51] M. Schröter, J. Berntgen, W. Kraus, H.-J. Wassener, and H.-J. Strobel, “Scalable HICUM model for SiGe HBTs”, ECOMPASS Workshop, Bonn (Germany), 2002.
[2-3] M. Schröter, “Overview on the HICUM bipolar transistor model”, invited tutorial at the Modeling Workshop of the Fabless Semiconductor Association (FSA), San Jose (CA), Sept. 2002.
[2-1] M. Schröter, “The advanced compact bipolar transistor model HICUM”, invited tutorial at the ANALOG 2002 in Bremen (Germany), May 2002.
[3-2] M. Schröter, Chapters “Advanced compact bipolar transistor models - HICUM” and “Generalized Integral Charge-Control Relation” in “The SiGe Handbook”, ed. by J. Cressler, to appear in 2005.

Publications Dr.-Ing. P. Sakalas

[83] J.Herricht, P.Sakalas, A.Chakravorty, M.Schröter, "Transistor-Kompaktmodell mit korrelierten Rauschquellen für sehr hohe Frequenzen" ITG-Fachbericht ANALOG’06, 196, 27-29 September, Dresden, VDE VERLAG GMBH, Berlin und Offenbach, Deutschland, EU, ISBN 978-3-8007-2988-3, ISBN 3-8007-2988-1, Druck & Bindung: druckmuck@digital e.K., Berlin,2006
[82] P.Sakalas, A.Chakravorty, M.Schröter, M.Ramonas, J.Herricht, A.Shimukovitch, C.Jungemann, in CDR of International Conference on Simulation of Semiconductor Processes and Devices, SISPAD’06, Monterey, California, USA, 6-8 September, IEEE Catalog Number: 06TH8887 (softboard) and for CDR: 06TH8887C , ISBN 1-4244-0404-5 (softboard), for CDR 1-4244-0590-4, Library of Congress 2006924884,2006
[81] P.Sakalas, J.Herricht, A.Chakravorty, M.Schröter, "Compact Modeling of High Frequency Noise Correlated Noise in HBTs", Proc. of the 2006 Bipolar/BiCMOS Circuits and Technology Meeting, BCTM’06, Maastricht, The Netherlands, EU, edited by Suvisoft Oy Ltd., IEEE Catalog Number: 06CH37813, ISBN 1-4244-0458-4,pp.279-282, 2006
[80] P.Sakalas, J.Herricht, "High Frequency Noise Investigations in HBTs using Compact Model Approach" invited talk at IEEE MTT IMS WMC Workshop “Noise in SiGe and III_V HBTs and Circuits: Opportunities and Challenges”, CDR, San Francisco, CA, USA, June 11, 2006
[79] P.Sakalas, M.Schröter, P.Zampardi, "Investigation of shot noise reduction mechanism in InGaP with different base thickness", Proc of the 18th International Conference Noise and Fluctuations, ICNF’05, Salamancaedited by T.Gonzalez, J. Mateos, D.Pardo, 2005 American Institute of physics ISBN 0-7354-0267-1/05/$22.50, pp.303-306, 2005
[78] J.Herricht, P.Sakalas, M.Schröter, P.Zampardi, Y.Zimmermann, F.Korndörfer, A.Simukovic, "Verification of p-Equivalent Circuit based microwave Noise Model on AIIIBV HBTs with Emphasis on HICUM", IEEE MTT, International Microwave Symposium Digest (CD-R), Long Beach, CA, USA, (www.ims2005.org), June 11-17, 2005.
[77] P.Sakalas, J.Herricht, M.Schröter, "Noise Modeling and Experimental Results for BiCMOS and III-V technology", (Invited talk), in Presentation Notes of the IEEE Workshop on Compact Modeling for RF/Microwave Applications, Montreal, Delft University of Technology, Sept 15, 2004.
[76] M. Schröter, P. Sakalas, W. Kraus, L. Kornau, J. Herricht, "Modeling of LEC Si/SiGe power transistors with HICUM", IEEE Workshop on Power Amplifiers for Wireless Communications, San Diego, CA, 2003.
[75] M.Schröter, P.Sakalas, H.Tran, "Modeling of distortion in bipolar transistors - A review", in Digest. of SMIC, 5th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, September 8-10, 2004 Atlanta, Georgia, USA, pp.131-134, 2004.
[74] P.Sakalas, M.Schröter, L.Kornau, W.Kraus, J.Herricht, "Modeling of SiGe Power HBT Intermodulation Distortion using HICUM", Tätigkeitsbericht 2003 TU Dresden Fakultät Elektronik und Informationstechnik, Institut für Grundlagen der Elektrotechnik und Elektronik, pp.50-53, 2003.
[73] P.Sakalas, M.Schröter, L.Kornau, W.Kraus , "Modeling of SiGe Power HBT IM Distortion", HICUM Workshop 2003, Dresden, http://www.iee.et.tu-dresden.de/iee/eb/forsch/Models/workshop0603/workshop0603.html.
[72] P.Sakalas, M.Schröter, R.F.Scholz, H.Jiang, M.Racanelli, "Analysis of Microwave Noise sources in 150 GHz SiGe HBTs", IEEE MTT, RFIC’04 Digest of Papers, Edit. Yann Deval, 04H37536, Fort Worth, June 6-8, pp.291-294, 2004
[71] P.Sakalas, M.Schröter, P.Zampardi, M.Racanelli, "Microwave noise in III-V and SiGe based HBTs, comparison, trends, numbers", invited talk, SPIE conf. Fluctuations and Noise, Proc. of SPIE Vol.5470, Conf. 5470 Noise in Devices and Circuits II, Gran Canaria, 23-27 June, Vol.5470, ISSN 0277-786X, ISBN 0-8194-5396-X, pp.151-163, 2004
[70] P.Sakalas, M.Schröter, P.Zampardi,, H.Zirath, "Shot noise reduction in AlGaAs/GaAs and InP/GaAs based HBTs", SPIE conf. Fluctuations and Noise, Proc. of SPIE Vol.5113, Conf. 5470 Noise in Devices and Circuits I, Santa Fe, New Mexico, ed. J.Deen, Zeynep, Celik-Butler, Michael Levinshtein, ISSN 0277-786X, ISBN 0-8194-4973-3, USA, 2-4 June, pp.387-396, 2003
[69] P.Sakalas, M.Schröter, L.Kornau, W.Kraus, J.Herricht, "Modeling of SiGe Power HBT Intermodulation Distortion using HICUM", Proc. Of 33rd European solid-State Device Research Conference, ESSDERC’03, ed .J Franca, P.Freitas, ISBN 0-7803-7999-3, 16-18 September, Estoril, Portugal, pp.311-314, 2003.



A. Mukherjee, L.Hofmann
27 October 2010