Professur Elektronische Bauelemente und Integrierte Schaltungen

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Laboratory On-Wafer-High frequency measuring technique

Lab - Calendar

  • General view of the CEDIC high frequency laboratory (P1)
  • Manual probestation for probing DC test structures for I(V) measurements. Precision LCR meter allows to measure capacitances, inductances up to 1 MHz frequency. Four cahnnel semiconductor parameter analyzer HP4142 (P2)
  • VNA HP8510C working from 45 MHz up to 50 GHz. and Maury tuner controller on the top. (P3)
  • Two spectrum analysers E4440 and E4448 and 50 GHz signal generator for two tone intermodulation distortion measurements. (P4)
  • A semiautomatic probestation from SUSS Mictrotech with adapted Maury tuner systems MT982E (0.75-8GHz) and MT984A (8-50 GHz) for noise parameter and load pull measurements. (P5) Details (P6, P7)


P1

P2

P3

P4

P5

P6

P7



L.Hofmann
25. März 2009