User contributions

• "Millimeter-Wave Characterization and test-benches" :M. Spirito, L. Galatro, G. Gentile, S. Galbano (TU Delft) (pdf-File)
• "Status of HICUM/L0 Model" :A. Mukherjee, A. Pawlak, M. Schröter (TU Dresden) (pdf-File)
• "Status of HICUM/L2 Model" :A. Mukherjee, A. Pawlak, M. Schröter (TU Dresden) (pdf-File
• "HBT geometry scaling: issues and solutions" :M. Schröter (TU Dresden) (pdf-File)
• "B5T model status, issues, scaling" :J. Krause, M. Schröter (TU Dresden) (pdf-File)
• "Geometry Scalable Model Parameter Extraction for mm-Wave SiGe-Heterojunction Transistors" :A. Pawlak, M. Schröter, A. Fox (TU Dresden; IHP Frankfurt/Oder) (pdf-File)

• "Benchmarking Circuits for Model Verification" :L. Vera, J.R. Long (TU Delft) (pdf-File)
• "Automated Transit Time and Transfer Current Extraction for Single Transistor Geometries" :T. Rosenbaum, M. Schröter, A. Pawlak (TU Dresden) (pdf-File)

• "Base Resistance Contributions in SiGe HBT Devices" :F. Stein (ST (pdf-File)
• "A scalable compact model for InP DHBTs" :T. Nardmann, P. Sakalas, M. Schröter (TU Dresden) (pdf-File)
• "Systematic Compact Modeling of Correlated Noise in HICUM" :P. Sakalas, A. Mukherjee, M. Schröter (TU Dresden) (pdf-File)

Lutz Hofmann
hofmann@iee.et.tu-dresden.de