User contributions

• "HICUM - Model L2 and L0 Status Overview": A. Mukherjee, M. Schröter, A. Pawlak (CEDIC) (pdf-File)
• "Sensitivity of LNA performance characteristics to individual characteristics to individual HICUM parametersHICUM parameters": M. Weststrate, S. Sinha (UP); A. Mukherjee, M. Schröter (CEDIC) (pdf-File)
• "First results with HiCuM2.30": C. Raya (XMOD) (pdf-File)
• "Application of HICUM Level0 v1.2 to Infineons B6CA Technologie": J. Berkner (infineon) (pdf-File)
• "Limitations of Bipolar Compact Models for Low Frequency NoiseApplication to HICUM": N. Derrier (STM) (pdf-File)
• "Evaluation of single-transistor extraction methods for HBT series resistances": T. Nardmann, J. Krause, S. Lehmann (CEDIC) (pdf-File)
• "HiCuM model enhancement for reliability investigation": S. Ghosh, F. Marc, C. Maneux, B. Grandchamp, G. A. Koné, S. Fregonese, T. Zimmer (IMS); B. Ardouin, C. Raya (XMOD) (pdf-File)

• "Model development activities and future directions": M. Schröter (CEDIC) (pdf-File)
• "HICUM/L2 v2.30 overview": A. Pawlak, M. Schröter, A. Mukherjee, T. Kessler (CEDIC) (pdf-File)
• "Thermal Modeling of Power Devices": K. E. Moebus, Y.Zimmermann, G.Wedel, M.Schröter (CEDIC) (pdf-File)
• "A Novel Low-bias Charge Concept for HBT/BJT Models Including Heterobandgap and Temperature Effects – Part I: Theory and Model Implementation": Z. Huszka, E. Seebacher (AMS) D. Céli (STM) (pdf-File)
• "A Novel Low-bias Charge Concept for HBT/BJT Models Including Heterobandgap and Temperature Effects - Part II: Parameter Extraction and Verification": D. Céli (STM); Z. Huszka, E. Seebacher (AMS) (pdf-File)

Lutz Hofmann
hofmann@iee.et.tu-dresden.de