Professur Elektronische Bauelemente und Integrierte Schaltungen
TU Dresden
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Fakultät Elektrotechnik und Informationstechnik
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Institut für Grundlagen der Elektrotechnik und Elektronik
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Thermal impedance of SiGe HBTs:Characterization and modeling
Methods for Extracting the Temperature and Power Dependent Thermal Resistance for SiGe and III-V HBTs from DC Measurements: A Review and Comparison Across Technologies
Geometry scalable compact modeling of GaAs HBTs
A Physics-Based Analytical Formulation for the Tunneling Current through the Base of Bipolar Transistors Operating at Cryogenic Temperatures
Device modeling tools and their application to SiGe HBT development
Long-Term Large-Signal RF Reliability Characterization of SiGe HBTs Using a Passive Impedance Tuner System
Characterization of Dynamic Large-Signal Operating Limits and Long-Term RF Reliability of SiGe HBTs
An Experimental Load-Pull Based Large-Signal RF Reliability Study of SiGe HBTs
A compact physical expression for the static drain current in heterojunction barrier CNTFETs
Compact formulation for the bias dependent quasistatic mobile charge in Schottky-barrier CNTFETs
L.Hofmann
10. Januar 2023