User contributions

• "HICUM - Productization and Support Update"; A.Mukherjee, M.Schröter, A.Chakravorty (CEDIC) (pdf-File)
• "Status of HICUM/L2 & HICUM/L0 implementation status in circuit Simulators: a real case"; E.Darcourt, N.Derrier (ST) (pdf-File)
• "New Models into SPICE using improved advanced Verilog-A Model compiler for SPICE3F5"; J.C.Perraud (CAEN) (pdf-File)
• "NQS effects and their implementation"; M.Schröter, A.Mukherjee, A.Chakravorty (CEDIC) (pdf-File)
• " HICUM status in Eldo/Eldo RF"; M.Selim (Mentor Graphics) (pdf_File)
• "Model Status: Agilent EEsof of EDA"; F.Sischka (Agilent) (pdf-File)

• "A stand-alone Hicum/L2v2.23 characterization environment in Matlab"; Z.Huszka (AMS) (pdf-File)
• "Experience with the HICUM Master Toolkit at National Semi"; J.Krause (CEDIC) (pdf-File)
• "Update of XMOD activities"; B.Ardouin (XMOD) (pdf-File)
• "New TRADICA features"; K.E.Moebus, M.Schröter, Y.Zimmermann, M.Claus (CEDIC) (pdf-File)

• "Advanced Device Simulation and Modeling"; M.Claus, G.Wedel, M.Schröter (CEDIC) (pdf-File)
• "Physics-based Analytical Modeling of Si-Ge Heterojunction Bipolar Transistor for High-speed Integrated Circuits"; H.Tran (CEDIC) (pdf-File)
• "Modeling of non-isothermal effects in DEVICE"; G.Wedel, M.Claus, M.Schröter (CEDIC) (pdf-File)
• "A Method for Bipolar Transistor Optimization in Process and Circuit Development"; K.E.Moebus (CEDIC) (pdf-File)
• "Statistical Simulation"; H.Wittkopf, H.Tran, K.E.Moebus (CEDIC) (pdf-File)

• "Normalized HICUM/L2 and new advancements in TF extraction"; Z.Huszka (AMS) (pdf-File)
• "A new transit time extraction algorithm based on matrix deembedding techniques"; C.Raya, N.Kaufmann, D.Celi (ST), T.Zimmer (IMS) (pdf-File)
• "Solving the Heat Equation with the Quadrupole Approach"; P.Y.Sulima, J.L.Battaglia, T.Zimmer (IMS) (pdf-File)
• "Extraction of thermal resistance and its temperature dependence using DC methods"; J.Berkner (Infineon) (pdf-File)

• "Modification of HICUM and GP model card for DFM (Design for Manufacturing) applications"; S.Yoshitomi (Toshiba) (pdf-File)
• "Base resistance modeling for advanced SiGe HBT process technologies"; S.Lehmann, J.Krause, M.Schröter (CEDIC) (pdf-File)
• "Review of some HICUM/L2 scaling laws: Issues and Proposals"; D.Celi (ST) (pdf-File)
• "Non-standard geometry scaling effects"; M.Schröter, S.Lehmann (CEDIC), D.Celi (ST) (pdf-File)

• "HICUM/L0-Investigation and Improvement of the DC- High current modeling"; C.Thiele (Infineon) (pdf-File)
• "HICUM/L0 temperature modeling: towards improvement"; H.Beckrich, F.Pourchon (ST) (pdf-File)

Lutz Hofmann
hofmann@iee.et.tu-dresden.de